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Information card for entry 1550168
Preview
| Coordinates | 1550168.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H43 Ir O2 Si |
|---|---|
| Calculated formula | C40 H43 Ir O2 Si |
| SMILES | [Ir]1234567([c]8([cH]4[cH]3[c]32[c]18Cc1c(c2c(C3)c(OC)cc3c2cccc3)c2c(cc1OC)cccc2)[Si](C)(C)C)[CH]1CC[CH]7=[CH]6CC[CH]5=1 |
| Title of publication | Mild complexation protocol for chiral CpxRh and Ir complexes suitable for in situ catalysis |
| Authors of publication | Cramer, Nicolai; Audic, Benoit; Wodrich, Matthew D. |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 10.1531 ± 0.0002 Å |
| b | 14.0965 ± 0.0003 Å |
| c | 23.1228 ± 0.0006 Å |
| α | 90° |
| β | 102.019 ± 0.002° |
| γ | 90° |
| Cell volume | 3236.86 ± 0.13 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0448 |
| Residual factor for significantly intense reflections | 0.0409 |
| Weighted residual factors for significantly intense reflections | 0.0881 |
| Weighted residual factors for all reflections included in the refinement | 0.0912 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 211729 (current) | 2018-11-01 | cif/ Adding structures of 1550165, 1550166, 1550167, 1550168 via cif-deposit CGI script. |
1550168.cif |
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Users of the data should acknowledge the original authors of the
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