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Information card for entry 1550169
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| Coordinates | 1550169.cif |
|---|---|
| Structure factors | 1550169.hkl |
| Original IUCr paper | HTML |
| Chemical name | Bis(tetramethylguanidinium) hexachloridotellurate(IV) |
|---|---|
| Formula | C10 H28 Cl6 N6 Te |
| Calculated formula | C10 H28 Cl6 N6 Te |
| SMILES | [Te](Cl)(Cl)(Cl)(Cl)([Cl-])[Cl-].[NH2+]=C(N(C)C)N(C)C.[NH2+]=C(N(C)C)N(C)C |
| Title of publication | Bis(tetramethylguanidinium) hexachloridotellurate(IV) |
| Authors of publication | Giltzau, Niels Ole; Köckerling, Martin |
| Journal of publication | IUCrData |
| Year of publication | 2018 |
| Journal volume | 3 |
| Journal issue | 10 |
| Pages of publication | x181488 |
| a | 7.3899 ± 0.0005 Å |
| b | 22.447 ± 0.002 Å |
| c | 28.512 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4729.6 ± 0.6 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 70 |
| Hermann-Mauguin space group symbol | F d d d |
| Hall space group symbol | -F 2uv 2vw |
| Residual factor for all reflections | 0.0142 |
| Residual factor for significantly intense reflections | 0.0128 |
| Weighted residual factors for significantly intense reflections | 0.0333 |
| Weighted residual factors for all reflections included in the refinement | 0.0342 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.256 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 211748 (current) | 2018-11-01 | cif/ hkl/ Adding structures of 1550169 via cif-deposit CGI script. |
1550169.cif 1550169.hkl |
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