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Information card for entry 1565761
Preview
| Coordinates | 1565761.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H20 N2 Pb S4 |
|---|---|
| Calculated formula | C12 H20 N2 Pb S4 |
| SMILES | [Pb]12([S]=C(S1)N1CCCCC1)[S]=C(S2)N1CCCCC1 |
| Title of publication | Morphological influence of deposition routes on lead sulfide thin films |
| Authors of publication | Mlowe, Sixberth; Shombe, Ginena B.; Akerman, Matthew P.; Mubofu, Egid B.; O'Brien, Paul; Mashazi, Philani; Nyokong, Tebello; Revaprasadu, Neerish |
| Journal of publication | Inorganica Chimica Acta |
| Year of publication | 2019 |
| Journal volume | 498 |
| Pages of publication | 119116 |
| a | 16.086 ± 0.003 Å |
| b | 22.565 ± 0.004 Å |
| c | 4.4482 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1614.6 ± 0.5 Å3 |
| Cell temperature | 102 ± 2 K |
| Ambient diffraction temperature | 102 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n 21 a |
| Hall space group symbol | P -2ac -2n |
| Residual factor for all reflections | 0.0226 |
| Residual factor for significantly intense reflections | 0.0202 |
| Weighted residual factors for significantly intense reflections | 0.042 |
| Weighted residual factors for all reflections included in the refinement | 0.0427 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.909 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 271414 (current) | 2021-12-14 | cif/ Adding structures of 1565761 via cif-deposit CGI script. |
1565761.cif |
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Users of the data should acknowledge the original authors of the
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