Crystallography Open Database

Information card for entry 2241774

Preview

Coordinates	2241774.cif
Structure factors	2241774.hkl
Original IUCr paper	HTML

Structure parameters

Chemical name	Bis[<i>N</i>,<i>N</i>-bis(2-methoxyethyl)dithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV)
Formula	C22 H30 N2 O2 S4 Sn
Calculated formula	C22 H30 N2 O2 S4 Sn
SMILES	C1(=[S][Sn]2(S1)(c1ccccc1)(SC(=[S]2)N(C)CCOC)c1ccccc1)N(CCOC)C
Title of publication	Distinct coordination geometries in bis[<i>N</i>,<i>N</i>-bis(2-methoxyethyl)dithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV) and bis[<i>N</i>-(2-methoxyethyl)-<i>N</i>-methyldithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV): crystal structures and Hirshfeld surface analysis
Authors of publication	Mohamad, Rapidah; Awang, Normah; Jotani, Mukesh M.; Tiekink, Edward R. T.
Journal of publication	Acta Crystallographica Section E
Year of publication	2016
Journal volume	72
Journal issue	8
Pages of publication	1130 - 1137
a	18.3808 ± 0.0014 Å
b	8.2809 ± 0.0004 Å
c	19.083 ± 0.003 Å
α	90°
β	118.071 ± 0.008°
γ	90°
Cell volume	2562.9 ± 0.5 Å³
Cell temperature	293 ± 2 K
Ambient diffraction temperature	293 ± 2 K
Number of distinct elements	6
Space group number	15
Hermann-Mauguin space group symbol	C 1 2/c 1
Hall space group symbol	-C 2yc
Residual factor for all reflections	0.0304
Residual factor for significantly intense reflections	0.0256
Weighted residual factors for significantly intense reflections	0.0604
Weighted residual factors for all reflections included in the refinement	0.0628
Goodness-of-fit parameter for all reflections included in the refinement	1.065
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	Yes

Version history

Revision	Date	Message	Files
184531 (current)	2016-07-20	cif/ hkl/ Adding structures of 2241774, 2241775 via cif-deposit CGI script.	2241774.cif 2241774.hkl