Crystallography Open Database

Information card for entry 2241775

Preview

Coordinates	2241775.cif
Structure factors	2241775.hkl
Original IUCr paper	HTML

Structure parameters

Chemical name	Bis[<i>N</i>-(2-methoxyethyl)-<i>N</i>-methyldithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV)
Formula	C26 H38 N2 O4 S4 Sn
Calculated formula	C26 H38 N2 O4 S4 Sn
SMILES	[Sn]12(SC(=[S]1)N(CCOC)CCOC)(SC(=[S]2)N(CCOC)CCOC)(c1ccccc1)c1ccccc1
Title of publication	Distinct coordination geometries in bis[<i>N</i>,<i>N</i>-bis(2-methoxyethyl)dithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV) and bis[<i>N</i>-(2-methoxyethyl)-<i>N</i>-methyldithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV): crystal structures and Hirshfeld surface analysis
Authors of publication	Mohamad, Rapidah; Awang, Normah; Jotani, Mukesh M.; Tiekink, Edward R. T.
Journal of publication	Acta Crystallographica Section E
Year of publication	2016
Journal volume	72
Journal issue	8
Pages of publication	1130 - 1137
a	7.4386 ± 0.0004 Å
b	14.3334 ± 0.0008 Å
c	16.5398 ± 0.001 Å
α	110.32 ± 0.005°
β	91.282 ± 0.005°
γ	101.865 ± 0.004°
Cell volume	1609.93 ± 0.17 Å³
Cell temperature	293 ± 2 K
Ambient diffraction temperature	293 ± 2 K
Number of distinct elements	6
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0418
Residual factor for significantly intense reflections	0.0312
Weighted residual factors for significantly intense reflections	0.0696
Weighted residual factors for all reflections included in the refinement	0.0782
Goodness-of-fit parameter for all reflections included in the refinement	1.058
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	Yes

Version history

Revision	Date	Message	Files
184531 (current)	2016-07-20	cif/ hkl/ Adding structures of 2241774, 2241775 via cif-deposit CGI script.	2241775.cif 2241775.hkl