Crystallography Open Database

Information card for entry 2243561

Preview

Coordinates	2243561.cif
Structure factors	2243561.hkl
Original IUCr paper	HTML

Structure parameters

Chemical name	Di-μ-oxido-bis{2,6-bis[(dimethylamino)methyl]phenyl-κ<i>C</i>^1^}tellurium(IV) bis[trichlorido(dimethyl sulfoxide-κ<i>S</i>)platinate(II)]
Formula	C28 H50 Cl6 N4 O4 Pd2 S2 Te2
Calculated formula	C28 H50 Cl6 N4 O4 Pd2 S2 Te2
SMILES	[Te]123(O[Te]45([N](Cc6c5c(ccc6)C[N]4(C)C)(C)C)O2)[N](Cc2c1c(ccc2)C[N]3(C)C)(C)C.[Pd](Cl)([S](=O)(C)C)(Cl)Cl.[Pd]([S](=O)(C)C)(Cl)(Cl)Cl
Title of publication	Structure of a diorganotelluroxonium(IV) cation, {[2,6-(CH~2~NMe~2~)~2~C~6~H~3~Te(μ-O)]~2~}^2+^, with the trichlorido(dimethyl sulfoxide)platinum(II) anion
Authors of publication	Gupta, Anand; Deka, Rajesh; Butcher, Ray J.; Singh, Harkesh B.
Journal of publication	Acta Crystallographica Section E
Year of publication	2020
Journal volume	76
Journal issue	9
Pages of publication	1520 - 1524
a	9.6333 ± 0.0019 Å
b	12.77 ± 0.003 Å
c	17.956 ± 0.004 Å
α	73.82 ± 0.03°
β	83.55 ± 0.03°
γ	88.86 ± 0.03°
Cell volume	2107.8 ± 0.9 Å³
Cell temperature	100 ± 2 K
Ambient diffraction temperature	100 ± 2 K
Number of distinct elements	8
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0264
Residual factor for significantly intense reflections	0.0222
Weighted residual factors for significantly intense reflections	0.0506
Weighted residual factors for all reflections included in the refinement	0.0516
Goodness-of-fit parameter for all reflections included in the refinement	0.987
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	Yes

Version history

Revision	Date	Message	Files
255742 (current)	2020-08-29	cif/ hkl/ Adding structures of 2243561 via cif-deposit CGI script.	2243561.cif 2243561.hkl