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Information card for entry 4131453
Preview
| Coordinates | 4131453.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H27 |
|---|---|
| Calculated formula | C28 H27 |
| SMILES | [C]12c3c4cccc3C(c3c1c(ccc3)C(c1c2c(C4(C)C)ccc1)(C)C)(C)C |
| Title of publication | Boron-Stabilized Planar Neutral π-Radicals with Well-Balanced Ambipolar Charge-Transport Properties. |
| Authors of publication | Kushida, Tomokatsu; Shirai, Shusuke; Ando, Naoki; Okamoto, Toshihiro; Ishii, Hiroyuki; Matsui, Hiroyuki; Yamagishi, Masakazu; Uemura, Takafumi; Tsurumi, Junto; Watanabe, Shun; Takeya, Jun; Yamaguchi, Shigehiro |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 41 |
| Pages of publication | 14336 - 14339 |
| a | 9.9421 ± 0.0017 Å |
| b | 18.521 ± 0.003 Å |
| c | 10.742 ± 0.0019 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1978 ± 0.6 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0454 |
| Residual factor for significantly intense reflections | 0.0411 |
| Weighted residual factors for significantly intense reflections | 0.1125 |
| Weighted residual factors for all reflections included in the refinement | 0.117 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 241651 (current) | 2019-11-25 | cif/ Adding structures of 4131453 via cif-deposit CGI script. |
4131453.cif |
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Users of the data should acknowledge the original authors of the
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