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Information card for entry 4131454
Preview
| Coordinates | 4131454.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H34 B |
|---|---|
| Calculated formula | C37 H34 B |
| SMILES | c12B3c4c5cccc4C(c2ccc2c1[C]1c4c(C(c6c1c3c(C5(C)C)cc6)(C)C)cccc4C2(C)C)(C)C |
| Title of publication | Boron-Stabilized Planar Neutral π-Radicals with Well-Balanced Ambipolar Charge-Transport Properties. |
| Authors of publication | Kushida, Tomokatsu; Shirai, Shusuke; Ando, Naoki; Okamoto, Toshihiro; Ishii, Hiroyuki; Matsui, Hiroyuki; Yamagishi, Masakazu; Uemura, Takafumi; Tsurumi, Junto; Watanabe, Shun; Takeya, Jun; Yamaguchi, Shigehiro |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 41 |
| Pages of publication | 14336 - 14339 |
| a | 11.072 ± 0.003 Å |
| b | 10.956 ± 0.003 Å |
| c | 11.177 ± 0.003 Å |
| α | 90° |
| β | 94.804 ± 0.008° |
| γ | 90° |
| Cell volume | 1351.1 ± 0.6 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0832 |
| Residual factor for significantly intense reflections | 0.0354 |
| Weighted residual factors for significantly intense reflections | 0.0743 |
| Weighted residual factors for all reflections included in the refinement | 0.0842 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.815 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 241652 (current) | 2019-11-25 | cif/ Adding structures of 4131454 via cif-deposit CGI script. |
4131454.cif |
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Users of the data should acknowledge the original authors of the
structural data.