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Information card for entry 4333730
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Coordinates | 4333730.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (disilox)4CrNa(thf) |
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Formula | C40 H92 Cr Na O5 Si4 |
Calculated formula | C40 H92 Cr Na O5 Si4 |
SMILES | [O]1([Cr]2([O]([Na]1([O]2[Si](C(C)(C)C)(C)C(C)(C)C)[O]1CCCC1)[Si](C(C)(C)C)(C(C)(C)C)C)[O][Si](C(C)(C)C)(C)C(C)(C)C)[Si](C(C)(C)C)(C(C)(C)C)C |
Title of publication | Chromium(IV) Siloxide |
Authors of publication | Michael P. Marshak; Daniel G. Nocera |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 1173 - 1175 |
a | 21.8239 ± 0.0012 Å |
b | 18.8675 ± 0.001 Å |
c | 25.0854 ± 0.0014 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 10329.2 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0694 |
Residual factor for significantly intense reflections | 0.0433 |
Weighted residual factors for significantly intense reflections | 0.1042 |
Weighted residual factors for all reflections included in the refinement | 0.1217 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
179440 (current) | 2016-03-23 | cif/4/33/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/33/37. |
4333730.cif |
99534 | 2014-01-31 | cif/ Adding structures of 4333730 via cif-deposit CGI script. |
4333730.cif |
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Users of the data should acknowledge the original authors of the
structural data.