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Information card for entry 4514538
Preview
| Coordinates | 4514538.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H40 Br2 N2 Pt Si2 |
|---|---|
| Calculated formula | C43 H40 Br2 N2 Pt Si2 |
| SMILES | [Pt]1([n]2cc(ccc2c2[n]1cc(C#C[Si](C)(C)C)cc2)C#C[Si](C)(C)C)(C#Cc1cccc(Br)c1)C#Cc1cc(Br)ccc1.c1cc(ccc1)C |
| Title of publication | Facile and Equipment-Free Data Encryption and Decryption by Self-Encrypting Pt(II) Complex. |
| Authors of publication | Kang, Jiajia; Ni, Jun; Su, Mengmeng; Li, Yanqin; Zhang, Jianjun; Zhou, Huajun; Chen, Zhong-Ning |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2019 |
| Journal volume | 11 |
| Journal issue | 14 |
| Pages of publication | 13350 - 13358 |
| a | 7.2194 ± 0.0002 Å |
| b | 16.1521 ± 0.0004 Å |
| c | 18.698 ± 0.0005 Å |
| α | 108.926 ± 0.002° |
| β | 99.381 ± 0.002° |
| γ | 94.409 ± 0.002° |
| Cell volume | 2015.13 ± 0.1 Å3 |
| Cell temperature | 210 ± 2 K |
| Ambient diffraction temperature | 210 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0434 |
| Residual factor for significantly intense reflections | 0.0353 |
| Weighted residual factors for significantly intense reflections | 0.0863 |
| Weighted residual factors for all reflections included in the refinement | 0.0905 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 219723 (current) | 2019-10-28 | cif/ Adding structures of 4514538 via cif-deposit CGI script. |
4514538.cif |
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Users of the data should acknowledge the original authors of the
structural data.