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Information card for entry 4514539
Preview
Coordinates | 4514539.cif |
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Original paper (by DOI) | HTML |
Formula | C36.5 H33 Br2 Cl N2 Pt Si2 |
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Calculated formula | C36.5 H33 Br2 Cl N2 Pt Si2 |
SMILES | ClCCl.[n]12cc(ccc1c1ccc(C#C[Si](C)(C)C)c[n]1[Pt]2(C#Cc1cccc(c1)Br)C#Cc1cccc(c1)Br)C#C[Si](C)(C)C |
Title of publication | Facile and Equipment-Free Data Encryption and Decryption by Self-Encrypting Pt(II) Complex. |
Authors of publication | Kang, Jiajia; Ni, Jun; Su, Mengmeng; Li, Yanqin; Zhang, Jianjun; Zhou, Huajun; Chen, Zhong-Ning |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 14 |
Pages of publication | 13350 - 13358 |
a | 13.8249 ± 0.0018 Å |
b | 14.5831 ± 0.0019 Å |
c | 20.362 ± 0.003 Å |
α | 75.309 ± 0.002° |
β | 80.795 ± 0.002° |
γ | 67.378 ± 0.002° |
Cell volume | 3656.5 ± 0.9 Å3 |
Cell temperature | 210 ± 2 K |
Ambient diffraction temperature | 210 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0491 |
Residual factor for significantly intense reflections | 0.0355 |
Weighted residual factors for significantly intense reflections | 0.0799 |
Weighted residual factors for all reflections included in the refinement | 0.0866 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
254431 (current) | 2020-07-21 | cif/4 Fixing Z values and formulae |
4514539.cif |
219724 | 2019-10-28 | cif/ Adding structures of 4514539 via cif-deposit CGI script. |
4514539.cif |
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Users of the data should acknowledge the original authors of the
structural data.