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Information card for entry 7234004
Preview
Coordinates | 7234004.cif |
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Original paper (by DOI) | HTML |
Formula | C28 H14 S4 |
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Calculated formula | C28 H14 S4 |
Title of publication | Thienoacene dimers based on the thieno[3,2-b]thiophene moiety: synthesis, characterization and electronic properties |
Authors of publication | Claude Niebel; Yeongin Kim; Christian Ruzie; Jolanta Karpinska; Basab Chattopadhyay; Guillaume Schweicher; Audrey Richard; Vincent Lemaur; Yoann Olivier; Jerome Cornil; Alan R. Kennedy; Ying Diao; Wen-Ya Lee; Stefan Mannsfeld; Zhenan Bao; Yves H. Geerts |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2015 |
Journal volume | 3 |
Pages of publication | 674 - 685 |
a | 6.0452 ± 0.0005 Å |
b | 7.701 ± 0.0007 Å |
c | 43.405 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2020.7 ± 0.3 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 3 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0856 |
Residual factor for significantly intense reflections | 0.0762 |
Weighted residual factors for significantly intense reflections | 0.2156 |
Weighted residual factors for all reflections included in the refinement | 0.2296 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
218587 (current) | 2019-09-20 | cif/ Adding structures of 7234004 via cif-deposit CGI script. |
7234004.cif |
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Users of the data should acknowledge the original authors of the
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