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Information card for entry 7234005
Preview
| Coordinates | 7234005.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H8 S2 |
|---|---|
| Calculated formula | C14 H8 S2 |
| Title of publication | Thienoacene dimers based on the thieno[3,2-b]thiophene moiety: synthesis, characterization and electronic properties |
| Authors of publication | Claude Niebel; Yeongin Kim; Christian Ruzie; Jolanta Karpinska; Basab Chattopadhyay; Guillaume Schweicher; Audrey Richard; Vincent Lemaur; Yoann Olivier; Jerome Cornil; Alan R. Kennedy; Ying Diao; Wen-Ya Lee; Stefan Mannsfeld; Zhenan Bao; Yves H. Geerts |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2015 |
| Journal volume | 3 |
| Pages of publication | 674 - 685 |
| a | 11.8095 ± 0.0007 Å |
| b | 5.8538 ± 0.0003 Å |
| c | 7.9599 ± 0.0005 Å |
| α | 90° |
| β | 105.99 ± 0.006° |
| γ | 90° |
| Cell volume | 528.98 ± 0.06 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0467 |
| Residual factor for significantly intense reflections | 0.0439 |
| Weighted residual factors for significantly intense reflections | 0.1191 |
| Weighted residual factors for all reflections included in the refinement | 0.1244 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 218588 (current) | 2019-09-20 | cif/ Adding structures of 7234005 via cif-deposit CGI script. |
7234005.cif |
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Users of the data should acknowledge the original authors of the
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